GAGG(Ce) Scintillator (GAGG(Ce) Scintillation Crystal)
OST Photonics can supply GAGG(Ce) scintillation crystals upon your requests. We can offer a variety of design options and different types of GAGG(Ce) crystal materials to meet the needs of customers for their applications.
Application
Medical imaging: Widely used in SPECT, PET, and CT systems due to high spatial and energy resolution, improving diagnostic accuracy.
Security screening: Integrated into luggage and cargo inspection systems for detecting radioactive materials, benefiting from its high Z-effective and stability.
High-energy physics: Employed in particle detectors and calorimeters at accelerators, where fast response and radiation hardness are critical.
Industrial non-destructive testing (NDT): Applied in X-ray and γ-ray inspection systems for flaw detection in metals and composites.
Space exploration: Considered for satellite-based radiation monitoring instruments due to its robustness and performance in extreme environments.
Features
High light yield: Emits over 30,000 photons/MeV, one of the highest among oxide scintillators, enabling superior signal detection sensitivity.
Emission peak at ~540 nm: Matches well with silicon photomultipliers (SiPM), allowing for compact and efficient detector designs.
High density (~6.63 g/cm³): Provides strong γ-ray stopping power, ideal for high-energy radiation detection.
Non-hygroscopic and radiation-hard: Does not absorb moisture and maintains performance under prolonged radiation exposure, reducing packaging complexity and enhancing durability.
Fast decay time (~150 ns): Enables high counting rates and fast imaging, suitable for time-resolved applications like TOF-PET.
Types of GAGG(Ce) Scintillators
Type | Light yield | Decay time | Afterglow |
High light output type | 54000 photons/keV | <150 ns | ≤0.10%@20ms |
Low afterglow type | 45000 photons/keV | <70 ns | ≤0.02%@20ms |
Fast decay time type | 30000 photons/keV | <50 ns | ≤0.10%@20ms |
Balanced type | 42000 photons/keV | <90 ns | ≤0.10%@20ms |
Properties
Product Type | High light output type | Low afterglow type | Fast decay time type | Balanced type |
Scintillation decay time (ns) | ＜150 | ＜70 | ＜50 | ＜90 |
Emission peak wavelength (nm) | 520 | 520 | 520 | 520 |
Refractive index (peak wavelength) | 1.9 | 1.9 | 1.9 | 1.9 |
Density (g/cm3) | 6.6 | 6.6 | 6.6 | 6.6 |
Light yield (photoelectron /keV) | 54 | 45 | 30 | 42 |
Energy resolution ( 137Cs) (5x5x5 mm) | 6% | 6% | 7% | 6% |
Radiation hardness (rad) | 10^5 | 10^5 | 10^5 | 10^5 |
Crystal structure | Cube | Cube | Cube | Cube |
Cleavage plane | No | No | No | No |
Hygroscopic | No | No | No | No |
Mohs hardness | 8 | 8 | 8 | 8 |
Afterglow | ≤0.10%@20ms | ≤0.02%@20ms | ≤0.10%@20ms | ≤0.10%@20ms |